Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Save this search Download search results Subscribe to news feed Your filters: cql: author="Nardo, A." or (type any "bookEditor journalEditor issueEditor" and editor="Nardo, A.") Add to list Conference Paper P1 Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors A. Tajalli, E. Canato, A. Nardo, M. Meneghini, Arno Stockman (UGent) , Peter Moens, E. Zanoni and G. Meneghesso (2019) 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). In International Reliability Physics Symposium Add to list Journal Article A1 open access ESD-failure of E-mode GaN HEMTs : role of device geometry and charge trapping E. Canato, M. Meneghini, A. Nardo, F. Masin, A. Barbato, M. Barbato, Arno Stockman (UGent) , A. Banerjee, P. Moens, E. Zanoni, et al. (2019) MICROELECTRONICS RELIABILITY. 100-101.