Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: author="Mols, Y." or (type any "bookEditor issueEditor" and editor="Mols, Y.") Add to list Conference Paper P1 A defect characterization technique for the sidewall surface of Nano-ridge and Nanowire based Logic and RF technologies A. Vais, B. Hsu, O. Syshchyk, H. Yu, A. Alian, Y. Mols, V Kodandarama, K., B. Kunert, N. Waldron, Eddy Simoen (UGent) , et al. (2021) 2021 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). In International Reliability Physics Symposium Add to list Conference Paper C3 open access III/V nano-ridge engineering for device integration on 300 mm silicon B. Kunert, Davide Colucci (UGent) , M. Baryshnikova, Y. Mols, R. Alcotte, Dries Van Thourhout (UGent) , Cenk Ibrahim Özdemir (UGent) , Y. De Koninck, N. Kuznetsova, D. Yudistira, et al. (2021) Compound Semiconductor Week (CSW-2021), Abstracts. Add to list Journal Article A1 Electrical activity of extended defects in relaxed InxGa1−xAs hetero-epitaxial layers C. Claeys, P.-C. Hsu, Y. Mols, H. Han, H. Bender, F. Seidel, P. Carolan, C. Merckling, A. Alian, N. Waldron, et al. (2020) ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY. 9(3). Add to list Conference Paper C3 III-V photonic devices on Si B. Kunert, M. Baryshnikova, Y. Mols, Y. Shi, Dries Van Thourhout (UGent) , N. Kuznetsova, S. Kim, Cenk Ibrahim Özdemir (UGent) , M. Pantouvaki, J. Van Campenhout, et al. (2018) Joint ISTDM/ICSI 2018 Conference.