Academic Bibliography

Search 200 years of publications by Ghent University researchers.

Publication type

Year

Classification

Organization

Your filters: cql: author="Marcon, D" or (type any "bookEditor issueEditor" and editor="Marcon, D")

Add to list
Toward understanding positive bias temperature instability in fully recessed-gate GaN MISFETs

TL Wu, J Franco, D Marcon, B De Jaeger, Benoit Bakeroot (UGent) , S Stoffels, M Van Hove, G Groeseneken and S Decoutere

(2016) IEEE TRANSACTIONS ON ELECTRON DEVICES. 63(5). p.1853-1860
Add to list
Time Dependent Dielectric Breakdown (TDDB) evaluation of PE-ALD SiN gate dielectrics on AlGaN/GaN recessed gate D-mode MIS-HEMTs and E-mode MIS-FETs

TL Wu, D Marcon, B De Jaeger, M Van Hove, Benoit Bakeroot (UGent) , S Stoffels, G Groeseneken and S Decoutere

(2015) International Reliability Physics Symposium. In International Reliability Physics Symposium
Add to list
The impact of the gate dielectric quality in developing Au-free D-mode and E-mode recessed gate AlGaN/GaN transistors on a 200mm Si substrate

TL Wu, D Marcon, B De Jaeger, M Van Hove, B Bakeroot, DN Lin, S Stoffels, XW Kang, R Roelofs, G Groeseneken, et al.

(2015) Proceedings of the International Symposium on Power Semiconductor Devices & ICs. In Proceedings of the International Symposium on Power Semiconductor Devices & ICs p.225-228
Add to list
Si Trench Around Drain (STAD) technology of GaN-DHFETs on Si substrate for boosting power performance

P Srivastava, H Oprins, M Van Hove, J Das, PE Malinowski, Benoit Bakeroot (UGent) , D Marcon, D Visalli, X Kang, S Lenci, et al.

(2011) 2011 IEEE International electron devices meeting (IEDM).