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Low-frequency noise spectroscopy of bulk and border traps in nanoscale devices
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Defect engineering for shallow n-type junctions in germanium : facts and fiction
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Distinction between silicon and oxide traps using single-trap spectroscopy
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Low frequency noise spectroscopy of bulk and border traps in nanoscale devices
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Towards single-trap spectroscopy: generation-recombination noise in UTBOX SOI nMOSFETs
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- Journal Article
- A1
- open access
In-band label extractor based on Cascaded Si ring resonators enabling 160 Gb/s optical packet switching modules