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A case study of ALD encapsulation of quantum dots: embedding supported CdSe/CdS/ZnS quantum dots in a ZnO matrix
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- Journal Article
- A1
- open access
In situ synchrotron based x-ray techniques as monitoring tools for atomic layer deposition
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Atomic layer deposition-based tuning of the pore size in mesoporous thin films studied by in situ grazing incidence small angle X-ray scattering
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Atomic layer deposition of TiO₂ on surface modified nanoporous low-k films
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- Conference Paper
- C3
- open access
In situ characterization of ALD in mesoporous thin films by grazing incidence small angle X-ray scattering
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Tuning the pore size of ink-bottle mesopores by atomic layer deposition
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Tailoring nanoporous materials by atomic layer deposition
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In situ X-ray fluorescence measurements during atomic layer deposition: nucleation and growth of TiO2 on planar substrates and in nanoporous films
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- Conference Paper
- C3
- open access
In situ x-ray fluorescence measurements during ALD on flat substrates and in nanoporous