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A case study of ALD encapsulation of quantum dots: embedding supported CdSe/CdS/ZnS quantum dots in a ZnO matrix
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Atomic layer deposition-based tuning of the pore size in mesoporous thin films studied by in situ grazing incidence small angle X-ray scattering
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- Conference Paper
- C3
- open access
In situ synchrotron based XRF and GISAXS study of ALD encapsulation of supported nanocrystals
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- Journal Article
- A1
- open access
In situ synchrotron based x-ray techniques as monitoring tools for atomic layer deposition
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Synchrotron based in situ characterization during atomic layer deposition
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- Conference Paper
- C3
- open access
In situ characterization of atomic layer deposition in mesoporous thin films by grazing incidence small angle x-ray scattering
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- Conference Paper
- C3
- open access
Atomic layer deposition of platinum : GISAXS study of the initial island growth mode
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- Conference Paper
- C3
- open access
In situ GISAXS during atomic layer deposition of oxides on ordered quantum dots
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Atomic layer deposition of TiO₂ on surface modified nanoporous low-k films
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In situ study of ALD processes using synchrotron-based X-ray fluorescence and scattering techniques