Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: author="Lo, Ting-Chun" or (type any "bookEditor issueEditor" and editor="Lo, Ting-Chun") Add to list Journal Article A1 open access Toward understanding the failure mechanism in p-GaN gate HEMTs operating in reverse conduction diode mode Wei-Syuan Lin, Benoit Bakeroot (UGent) , Zhen-Hong Huang, Ting-Chun Lo, Matteo Borga, Dirk Wellekens, Niels Posthuma, Stefaan Decoutere and Tian-Li Wu (2024) IEEE TRANSACTIONS ON ELECTRON DEVICES. 71(8). p.4874-4878