Ghent University Academic Bibliography

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Pseudorabies virus infection triggers mitophagy to dampen the interferon response and promote viral replication

Yuan Zhao, Chan Ding, Zhenbang Zhu, Wenqiang Wang, Wei Wen, Herman Favoreel (UGent) and Xiangdong Li

(2024) JOURNAL OF VIROLOGY. 98(10).
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Investigating the current collapse mechanisms of p-GaN gate HEMTs by different passivation dielectrics

Xiangdong Li, Niels Posthuma, Benoit Bakeroot (UGent) , Hu Liang, Shuzhen You, Zhicheng Wu, Ming Zhao, Guido Groeseneken and Stefaan Decoutere

(2021) IEEE TRANSACTIONS ON POWER ELECTRONICS. 36(5). p.4927-4930
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Reliability of p-GaN gate HEMTs in reverse conduction

Deepthi Cingu, Xiangdong Li, Benoit Bakeroot (UGent) , Nooshin Amirifar, Karen Geens, Kristof J. P. Jacobs, Ming Zhao, Shuzhen You, Guido Groeseneken and Stefaan Decoutere

(2021) IEEE TRANSACTIONS ON ELECTRON DEVICES. 68(2). p.645-652
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Observation of dynamic V-TH of p-GaN Gate HEMTs by fast sweeping characterization

Xiangdong Li, Benoit Bakeroot (UGent) , Zhicheng Wu, Nooshin Amirifar, Shuzhen You, Niels Posthuma, Ming Zhao, Hu Liang, Guido Groeseneken and Stefaan Decoutere

(2020) IEEE ELECTRON DEVICE LETTERS. 41(4). p.577-580
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Modeling of the vertical leakage current in AlN/Si heterojunctions for GaN power applications

Matteo Borga, Carlo De Santi, S. Stoffels, Benoit Bakeroot (UGent) , Xiangdong Li, M. Zhao, M. Van Hove, S. Decoutere, Gaudenzio Meneghesso, Matteo Meneghini, et al.

(2020) IEEE TRANSACTIONS ON ELECTRON DEVICES. 67(2). p.595-599
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Integration of 650 V GaN power ICs on 200 mm engineered substrates

Xiangdong Li, Karen Geens, Dirk Wellekens, Ming Zhao, Alessandro Magnani, Nooshin Amirifar, Benoit Bakeroot (UGent) , Shuzhen You, Dirk Fahle, Herwig Hahn, et al.

(2020) IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING. 33(4). p.534-538
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Buffer vertical leakage mechanism and reliability of 200-mm GaN-on-SOI

Xiangdong Li, Ming Zhao, Benoit Bakeroot (UGent) , Karen Geens, Weiming Guo, Shuzhen You, Steve Stoffels, Vesa-Pekka Lempinen, Jaakko Sormunen, Guido Groeseneken, et al.

(2019) IEEE TRANSACTIONS ON ELECTRON DEVICES. 66(1). p.553-560
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Investigation on carrier transport through AIN nucleation layer from differently doped Si(111) substrates

Xiangdong Li, Marleen Van Hove, Ming Zhao, Benoit Bakeroot (UGent) , Shuzhen You, Guido Groeseneken and Stefaan Decoutere

(2018) IEEE TRANSACTIONS ON ELECTRON DEVICES. 65(5). p.1721-1727

Academic Bibliography

Pseudorabies virus infection triggers mitophagy to dampen the interferon response and promote viral replication

Investigating the current collapse mechanisms of p-GaN gate HEMTs by different passivation dielectrics

Reliability of p-GaN gate HEMTs in reverse conduction

Observation of dynamic V-TH of p-GaN Gate HEMTs by fast sweeping characterization

Modeling of the vertical leakage current in AlN/Si heterojunctions for GaN power applications

Integration of 650 V GaN power ICs on 200 mm engineered substrates

Buffer vertical leakage mechanism and reliability of 200-mm GaN-on-SOI

Investigation on carrier transport through AIN nucleation layer from differently doped Si(111) substrates

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