Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: author="Kang, Xuanwu" or (type any "bookEditor issueEditor" and editor="Kang, Xuanwu") Add to list Journal Article A1 Time-dependent breakdown mechanisms and reliability improvement in edge terminated AlGaN/GaN Schottky diodes under HTRB tests Jie Hu, Steve Stoffels, Ming Zhao, Andrea Natale Tallarico, Isabella Rossetto, Matteo Meneghini, Xuanwu Kang, Benoit Bakeroot (UGent) , Denis Marcon, Ben Kaczer, et al. (2017) IEEE ELECTRON DEVICE LETTERS. 38(3). p.371-374 Add to list Conference Paper P1 Positive bias temperature instability evaluation in fully recessed gate GaN MIS-FETs Tian-Li Wu, Jacopo Franco, Denis Marcon, Brice De Jaeger, Benoit Bakeroot (UGent) , Xuanwu Kang, Steve Stoffels, Marleen Van Hove, Guido Groeseneken and Stefaan Decoutere (2016) 2016 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). In International Reliability Physics Symposium