Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: author="Hegsted, Dan*" or (type exact bookEditor and editor="Hegsted, Dan*") Add to list Journal Article A1 Dielectric relaxation of MIM capacitor and its effect on Sigma-Delta A/D converters Zhenqui Ning, Herman Casier, Jeroen De Maeyer (UGent) , Erik Heirman, Ewin De Vylder, Koen Noldus, Geert Van Herzeele and Dan Hegsted (2008) IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING. 21(4). p.549-564 Add to list Conference Paper P1 Life condition monitoring on smart power devices using a sequence of current and charge-based capacitance measurements Zhenqiu Ning, Erwin De Vylder, Basil Vlachakis, H-X Delecourt, Renaud Gillon, Patrick Van Torre (UGent) and Dan Hegsted (2008) Microelectronic Test Structures, 2008. ICMTS 2008. IEEE International Conference on. p.46-51 Add to list Conference Paper P1 Analog characterization of dielectric relaxation of MIM capacitor using an improved recovery voltage technique Zhenqiu Ning, Herman Casier, Renaud Gillon, H-X Delecourt, Dimitri Tack, Erwin De Vylder, Patrick Van Torre (UGent) and Dan Hegsted (2007) IEEE International Conference on Microelectronic Test Structures. p.109-114