Show 15 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: author="Desjardins, Patrick" or (type exact bookEditor and editor="Desjardins, Patrick") Add to list Journal Article A1 Three dimensional reciprocal space measurement by x-ray diffraction using linear and area detectors: applications to texture and defects determination in oriented thin films and nanoprecipitates Simon Gaudet, Koen De Keyser, Samuel Lambert-Milot, Jean Jordan-Sweet, Christophe Detavernier (UGent) , Christian Lavoie and Patrick Desjardins (2013) JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. 31(2).