Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: author="De Vries, Hans*" or (type exact bookEditor and editor="De Vries, Hans*") Add to list Journal Article A1 Impact of geometry on stretchable meandered interconnect uniaxial tensile extension fatigue reliability Michal Jablonski (UGent) , Jan Vanfleteren (UGent) , Thomas Vervust (UGent) , Frederick Bossuyt, Riccardo Lucchini, Pasquale Vena, Hans De Vries and Mario Gonzalez (2015) MICROELECTRONICS RELIABILITY. 55(1). p.143-154 Add to list Journal Article A1 Reliability of a stretchable interconnect utilizing terminated, in-plane meandered copper conductor Michal Jablonski (UGent) , Frederick Bossuyt (UGent) , Jan Vanfleteren (UGent) , Thomas Vervust (UGent) and Hans de Vries (2013) MICROELECTRONICS RELIABILITY. 53(7). p.956-963