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Defect characterization in high-electron-mobility transistors with regrown p-GaN gate by low-frequency noise and deep-level transient spectroscopy
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Stability of Schottky Barrier Diode integrated in p-GaN Enhancement-mode GaN power technology
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ON-state reliability of GaN-on-Si Schottky Barrier Diodes : Si3N4 vs. Al2O3/SiO2 GET dielectric
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GaN-on-SOI : monolithically integrated All-GaN ICs for power conversion
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Influence of GaN- and Si3N4-passivation layers on the performance of AlGaN/GaN diodes with a gated edge termination
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Reliability improvements in AlGaN/GaN Schottky barrier diodes with a gated edge termination
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Optimization of the source field-plate design for low dynamic RDS-ON dispersion of AlGaN/GaN MIS-HEMTs
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Statistical analysis of the impact of anode recess on the electrical characteristics of AlGaN/GaN Schottky diodes with gated edge termination
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Positive bias temperature instability evaluation in fully recessed gate GaN MIS-FETs
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Device breakdown optimization of Al2O3/GaN MISFETs