Ghent University Academic Bibliography

Your filters: cql: author="Cheng, Weiwei" or (type any "bookEditor issueEditor" and editor="Cheng, Weiwei")

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- Journal Article
- A1
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On the Bayes-optimality of F-measure maximizers

Willem Waegeman (UGent) , Krzysztof Dembczyński, Arkadiusz Jachnik, Weiwei Cheng and Eyke Hüllermeier

(2014) JOURNAL OF MACHINE LEARNING RESEARCH. 15. p.3333-3388
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On label dependence and loss minimization in multi-label classification

Krzystzof Dembczyński, Willem Waegeman (UGent) , Weiwei Cheng and Eyke Hüllermeier

(2012) MACHINE LEARNING. 88(1-2). p.5-45
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- Conference Paper
- C1
- open access
Label ranking with partial abstention based on thresholded probabilistic models

Weiwei Cheng, Eyke Hüllermeier, Willem Waegeman (UGent) and Volkmar Welker

(2012) Advances in Neural Information Processing Systems. 25. p.2510-2518
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F-Measure maximization in topical classification

Weiwei Cheng, Krzysztof Dembczyński, Eyke Hüllermeier, Adrian Jaroszewicz and Willem Waegeman (UGent)

(2012) Lecture Notes in Artificial Intelligence. 7413. p.439-446
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An exact algorithm for F-measure maximization

Krzysztof Dembczyński, Willem Waegeman (UGent) , Weiwei Cheng and Eyke Hüllermeier

(2011) Neural information processing systems : 2011 conference book. p.69-69
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- Conference Paper
- C1
- open access
An exact algorithm for F-measure maximization

Krzysztof Dembczyński, Willem Waegeman (UGent) , Weiwei Cheng and Eyke Hüllermeier

(2011) Advances in Neural Information Processing Systems. 24.
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- Conference Paper
- C1
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Regret analysis for performance metrics in multi-label classification: the case of Hamming and subset zero-one loss

Krzysztof Dembszynski, Willem Waegeman (UGent) , Weiwei Cheng and Eyke Hüllermeier

(2010) LECTURE NOTES IN ARTIFICIAL INTELLIGENCE. 6321. p.280-295
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- Conference Paper
- C1
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On label dependence in multilabel classification

Krzysztof Dembszynski, Willem Waegeman (UGent) , Weiwei Cheng and Eyke Hüllermeier

(2010) LastCFP : ICML workshop on learning from multi-label data, Proceedings.
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Predicting partial orders: ranking with abstention

Weiwei Cheng, Michaël Rademaker (UGent) , Bernard De Baets (UGent) and Eyke Hüllermeier

(2010) Lecture Notes in Computer Science. 6321. p.215-230

Academic Bibliography

On the Bayes-optimality of F-measure maximizers

On label dependence and loss minimization in multi-label classification

Label ranking with partial abstention based on thresholded probabilistic models

F-Measure maximization in topical classification

An exact algorithm for F-measure maximization

An exact algorithm for F-measure maximization

Regret analysis for performance metrics in multi-label classification: the case of Hamming and subset zero-one loss

On label dependence in multilabel classification

Predicting partial orders: ranking with abstention

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