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Influence of the chalcogen element on the filament stability in Culn(Te,Se,S)(2)/Al2O3 filamentary switching devices
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Tuning the switching behavior of conductive-bridge resistive memory by the modulation of the cation-supplier alloys
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Understanding the dual nature of the filament dissolution in conductive bridging devices
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Scanning probe microscopy as a scalpel to probe filament formation in conductive bridging memory devices
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Three-dimensional observation of the conductive filament in nanoscaled resistive memory devices
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Switching mechanism and reverse engineering of low-power Cu-based resistive switching devices