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Trap identification on n-channel GAA NW FETs
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Low-frequency noise measurements at liquid helium temperature operation in ultra-thin buried oxide transistors : physical interpretation of transport phenomena
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Low-frequency noise spectroscopy of bulk and border traps in nanoscale devices
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Low frequency noise spectroscopy of bulk and border traps in nanoscale devices
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Towards single-trap spectroscopy: generation-recombination noise in UTBOX SOI nMOSFETs