Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Save this search Download search results Subscribe to news feed Your filters: cql: author="Canato, E." or (type any "bookEditor issueEditor" and editor="Canato, E.") Add to list Conference Paper P1 Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors A. Tajalli, E. Canato, A. Nardo, M. Meneghini, Arno Stockman (UGent) , Peter Moens, E. Zanoni and G. Meneghesso (2019) 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). In International Reliability Physics Symposium Add to list Conference Paper P1 Mu s-range evaluation of threshold voltage instabilities of GaN-on-Si HEMTs with p-GaN gate E. Canato, F. Masin, M. Borga, E. Zanoni, M. Meneghini, G. Meneghesso, Arno Stockman (UGent) , A. Banerjee and P. Moens (2019) 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). In International Reliability Physics Symposium Add to list Journal Article A1 open access ESD-failure of E-mode GaN HEMTs : role of device geometry and charge trapping E. Canato, M. Meneghini, A. Nardo, F. Masin, A. Barbato, M. Barbato, Arno Stockman (UGent) , A. Banerjee, P. Moens, E. Zanoni, et al. (2019) MICROELECTRONICS RELIABILITY. 100-101. Add to list Conference Paper P1 On the origin of the leakage current in p-gate AlGaN/GaN HEMTs Arno Stockman (UGent) , E. Canato, A. Tajalli, M. Meneghini, G. Meneghesso, E. Zanoni, P. Moens and Benoit Bakeroot (UGent) (2018) 2018 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). In International Reliability Physics Symposium p.4B.5-1-4B.5-4