Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: author="Canato, E." or (type any "bookEditor issueEditor" and editor="Canato, E.") Add to list Conference Paper P1 Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors A. Tajalli, E. Canato, A. Nardo, M. Meneghini, Arno Stockman, Peter Moens, E. Zanoni and G. Meneghesso (2019) 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). In International Reliability Physics Symposium Add to list Conference Paper P1 Mu s-range evaluation of threshold voltage instabilities of GaN-on-Si HEMTs with p-GaN gate E. Canato, F. Masin, M. Borga, E. Zanoni, M. Meneghini, G. Meneghesso, Arno Stockman, A. Banerjee and P. Moens (2019) 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). In International Reliability Physics Symposium Add to list Journal Article A1 open access ESD-failure of E-mode GaN HEMTs : role of device geometry and charge trapping E. Canato, M. Meneghini, A. Nardo, F. Masin, A. Barbato, M. Barbato, Arno Stockman, A. Banerjee, P. Moens, E. Zanoni, et al. (2019) MICROELECTRONICS RELIABILITY. 100-101. Add to list Conference Paper P1 On the origin of the leakage current in p-gate AlGaN/GaN HEMTs Arno Stockman, E. Canato, A. Tajalli, M. Meneghini, G. Meneghesso, E. Zanoni, P. Moens and Benoit Bakeroot (UGent) (2018) 2018 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). In International Reliability Physics Symposium p.4B.5-1-4B.5-4