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Low-frequency noise assessment of work function engineering cap layers in high-k gate stacks
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Random telegraph noise: the key to single defect studies in nano-devices
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Random telegraph noise: the key to single defect studies in nano-devices
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What do we know about hydrogen-induced thermal donors in silicon?
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Metal in-diffusion during Fe and co-germanidation of germanium
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Study of metal-related deep-level defects in germanide Schottky barriers on n-type germanium
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A DLTS study on plasma-hydrogenated n-type high-resistivity magnetic Cz silicon
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Lifetime and leakage current considerations in metal-doped germanium
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Deep level transient spectroscopy study of Pd and Pt sputtering damage in n-type germanium
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Hydrogen-plasma-induced thermal donors in high resistivity n-type magnetic Czochralski-grown silicon