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Understanding the dual nature of the filament dissolution in conductive bridging devices
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Scanning probe microscopy as a scalpel to probe filament formation in conductive bridging memory devices
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Three-dimensional observation of the conductive filament in nanoscaled resistive memory devices
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Influence of carbon content on the copper-telluride phase formation and on the resistive switching behavior of carbon alloyed Cu-Te conductive bridge random access memory cells
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Influence of carbon alloying on the thermal stability and resistive switching behavior of copper-telluride based CBRAM cells