Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: author="Barbato, A." or (type any "bookEditor issueEditor" and editor="Barbato, A.") Add to list Journal Article A1 open access ESD-failure of E-mode GaN HEMTs : role of device geometry and charge trapping E. Canato, M. Meneghini, A. Nardo, F. Masin, A. Barbato, M. Barbato, Arno Stockman, A. Banerjee, P. Moens, E. Zanoni, et al. (2019) MICROELECTRONICS RELIABILITY. 100-101.