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Methodological aspects of analytical chemistry
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- Journal Article
- A1
- open access
The metamorphosis of analytical chemistry
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- Journal Article
- A1
- open access
New Cs sputter ion source with polyatomic ion beams for secondary ion mass spectrometry applications
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- Journal Article
- A1
- open access
Static secondary ion mass spectrometry (S-SIMS) for the characterization of surface components in mineral particulates
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- Journal Article
- A1
- open access
The use of time-of-flight static secondary ion mass spectrometry imaging for the molecular characterization of single aerosol surfaces
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- Journal Article
- A1
- open access
Caesium sputter ion source compatible with commercial SIMS instruments
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Determination of lead isotope ratios in atmospheric aerosol collected in Beijing and Changdao, China
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X-ray fluorescence and emission : particle-induced X-ray emission
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- Journal Article
- A1
- open access
Semi-quantitative characterisation of binary salt mixtures with static secondary ion mass spectrometry (S-SIMS)
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- Journal Article
- A1
- open access
Feasibility of analyzing molecular pigments in paint layers using TOF S-SIMS