Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: author=" You, S." or (type any "bookEditor issueEditor" and editor=" You, S.") Add to list Conference Paper P1 Influence of drain and gate potential on gate failure in semi-vertical GaN-on-Si trench MOSFETs D. Favero, C. De Santi, K. Mukherjee, K. Geens, M. Borga, Benoit Bakeroot (UGent) , S. You, S. Decoutere, G. Meneghesso, E. Zanoni, et al. (2022) 2022 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). In International Reliability Physics Symposium Add to list Journal Article A1 Study and characterization of GaN MOS capacitors : planar vs trench topographies K. Mukherjee, C. De Santi, S. You, K. Geens, M. Borga, S. Decoutere, Benoit Bakeroot (UGent) , P. Diehle, F. Altmann, G. Meneghesso, et al. (2022) APPLIED PHYSICS LETTERS. 120(14). Add to list Journal Article A1 open access Compact modeling of nonideal trapping/detrapping processes in GaN power devices N. Modolo, C. De Santi, Giulio Baratella (UGent) , A. Bettini, M. Borga, N. Posthuma, Benoit Bakeroot (UGent) , S. You, S. Decoutere, A. Bevilacqua, et al. (2022) IEEE TRANSACTIONS ON ELECTRON DEVICES. 69(8). p.4432-4437