Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: author=" Geens, K." or (type any "bookEditor issueEditor" and editor=" Geens, K.") Add to list Conference Paper P1 High-temperature PBTI in trench-gate vertical GaN power MOSFETs : role of border and semiconductor traps D. Favero, A. Cavaliere, C. De Santi, M. Borga, Walter Gonçalez Filho (UGent) , K. Geens, Benoit Bakeroot (UGent) , S. Decoutere, G. Meneghesso, E. Zanoni, et al. (2023) 2023 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS. In International reliability physics symposium Add to list Conference Paper P1 Influence of drain and gate potential on gate failure in semi-vertical GaN-on-Si trench MOSFETs D. Favero, C. De Santi, K. Mukherjee, K. Geens, M. Borga, Benoit Bakeroot (UGent) , S. You, S. Decoutere, G. Meneghesso, E. Zanoni, et al. (2022) 2022 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). In International Reliability Physics Symposium Add to list Journal Article A1 Study and characterization of GaN MOS capacitors : planar vs trench topographies K. Mukherjee, C. De Santi, S. You, K. Geens, M. Borga, S. Decoutere, Benoit Bakeroot (UGent) , P. Diehle, F. Altmann, G. Meneghesso, et al. (2022) APPLIED PHYSICS LETTERS. 120(14). Add to list Journal Article A1 Impact of doping and geometry on breakdown voltage of semi-vertical GaN-on-Si MOS capacitors D. Favero, C. De Santi, K. Mukherjee, M. Borga, K. Geens, U. Chatterjee, Benoit Bakeroot (UGent) , S. Decoutere, F. Rampazzo, G. Meneghesso, et al. (2022) MICROELECTRONICS RELIABILITY. 138. Add to list Conference Paper P1 200 V GaN-on-SOI Smart Power Platform for Monolithic GaN Power ICs T. Cosnier, O. Syshchyk, B. De Jaeger, K. Geens, D. Cingu, Elena Fabris, M. Borga, A. Vohra, M. Zhao, Benoit Bakeroot (UGent) , et al. (2021) 2021 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM). In IEEE International Electron Devices Meeting