Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: author=" Fregolent, M." or (type any "bookEditor issueEditor" and editor=" Fregolent, M.") Add to list Journal Article A1 Capture and emission time map to investigate the positive VTH shift in p-GaN power HEMTs N. Modolo, M. Fregolent, F. Masin, A. Benato, A. Bettini, M. Buffolo, C. De Santi, M. Borga, N. Posthuma, Benoit Bakeroot (UGent) , et al. (2022) MICROELECTRONICS RELIABILITY. 138.