Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: author=" Diehle, P." or (type any "bookEditor issueEditor" and editor=" Diehle, P.") Add to list Journal Article A1 Study and characterization of GaN MOS capacitors : planar vs trench topographies K. Mukherjee, C. De Santi, S. You, K. Geens, M. Borga, S. Decoutere, Benoit Bakeroot (UGent) , P. Diehle, F. Altmann, G. Meneghesso, et al. (2022) APPLIED PHYSICS LETTERS. 120(14).