Show 10 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: author=" Buffolo, Matteo" or (type any "bookEditor issueEditor" and editor=" Buffolo, Matteo") Add to list Journal Article A1 open access Modeling the electrical degradation of micro-transfer printed 845 nm VCSILs for silicon photonics Michele Zenari (UGent) , Matteo Buffolo, Carlo De Santi, Jeroen Goyvaerts, Alexander Grabowski, Johan Gustavsson, Roel Baets (UGent) , Anders Larsson, Günther Roelkens (UGent) , Gaudenzio Meneghesso, et al. (2024) IEEE TRANSACTIONS ON ELECTRON DEVICES. 71(2). p.1131-1138