Show 50 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: author="Nardo, A." or (type any "bookEditor journalEditor issueEditor" and editor="Nardo, A.") Add to list Conference Paper P1 Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors A. Tajalli, E. Canato, A. Nardo, M. Meneghini, Arno Stockman, Peter Moens, E. Zanoni and G. Meneghesso (2019) 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). In International Reliability Physics Symposium Add to list Journal Article A1 open access ESD-failure of E-mode GaN HEMTs : role of device geometry and charge trapping E. Canato, M. Meneghini, A. Nardo, F. Masin, A. Barbato, M. Barbato, Arno Stockman, A. Banerjee, P. Moens, E. Zanoni, et al. (2019) MICROELECTRONICS RELIABILITY. 100-101.