Show 50 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: author="He, Liang" or (type exact bookEditor and editor="He, Liang") Add to list Journal Article A1 Gate metal and cap layer effects on Ge nMOSFETs low-frequency noise behavior Liang He, Pan Zhao, Jiahao Liu, Yahui Su, Hua Chen, Xiaofei Jia, Hiroaki Arimura, Jerome Mitard, Liesbet Witters, Naoto Horiguchi, et al. (2019) IEEE TRANSACTIONS ON ELECTRON DEVICES. 66(2). p.1050-1056