Show 5 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: parent exact "GETTERING AND DEFECT ENGINEERING IN SEMICONDUCTOR TECHNOLOGY" Add to list Journal Article A1 Extended defects in silicon: an old and new story Jan Vanhellemont (UGent) , Olivier De Gryse and Paul Clauws (UGent) (2004) GETTERING AND DEFECT ENGINEERING IN SEMICONDUCTOR TECHNOLOGY. 95-96. p.263-272 Add to list Journal Article A1 Minority carrier diffusion lengths in silicon doped gallium nitride thin films measured by Electron Beam Induced Current. C GRAZZI, M ALBRECHT, HP STRUNK, Zahia Bougrioua and Ingrid Moerman (UGent) (2002) GETTERING AND DEFECT ENGINEERING IN SEMICONDUCTOR TECHNOLOGY. 82-84. p.807-812