Show 5 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: author="Trojman, Lionel" or (type exact bookEditor and editor="Trojman, Lionel") Add to list Conference Paper P1 ON-state reliability of GaN-on-Si Schottky Barrier Diodes : Si3N4 vs. Al2O3/SiO2 GET dielectric Eliana Acurio, Lionel Trojman, Brice de Jaeger, Benoit Bakeroot (UGent) and Stefaan Decoutere (2021) 2021 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). In International Reliability Physics Symposium Add to list Journal Article A1 Influence of GaN- and Si3N4-passivation layers on the performance of AlGaN/GaN diodes with a gated edge termination Eliana Acurio, Felice Crupi, Nicolo Ronchi, Brice De Jaeger, Benoit Bakeroot (UGent) , Stefaan Decoutere and Lionel Trojman (2019) IEEE TRANSACTIONS ON ELECTRON DEVICES. 66(2). p.883-889 Add to list Journal Article A1 Reliability improvements in AlGaN/GaN Schottky barrier diodes with a gated edge termination Eliana Acurio, Felice Crupi, Nicolo Ronchi, Brice De Jaeger, Benoit Bakeroot (UGent) , Stefaan Decoutere and Lionel Trojman (2018) IEEE TRANSACTIONS ON ELECTRON DEVICES. 65(5). p.1765-1770