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- Journal Article
- A1
- open access
An effective modeling framework for the analysis of interconnects subject to line-edge roughness
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- Conference Paper
- P1
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Frequency- and time-domain analysis of high-frequency on-chip interconnects with nonuniform conductor edges
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- Journal Article
- A1
- open access
Stochastic modeling-based variability analysis of on-chip interconnects
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Propagation behavior of multilayer microstrips applied to interconnects running near embedded integrated components