Show 250 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: author exact 86FB21FE-B25E-11E6-B104-2D2FD0AF0289 cql: author exact F43EA4A2-F0ED-11E1-A9DE-61C894A0A6B4 Add to list Conference Paper C1 Comparing high-frequency de-embedding strategies: immittance correction and in-situ calibration. R GILLON, Wim Van De Sype, D VANHOENACKER and Luc Martens (UGent) (2000) Proceedings of the 2000 International Conference on Microelectronic Test Structures (ICMTS 2000), 13-16 March 2000, Monterey, California, USA. p.241-245