Show 20 5 10 15 20 50 100 250 Sort by year (new to old) Actions News feed Embed this list Save this search Mark all Export Your filters: cql: parent exact "GADEST, Abstracts" Mark conference C3 Impact of the gate material on the deep levels in a-Si:H/c-Si metal-insulator-semiconductor capacitors Eddy Simoen (UGent) , V Ferro and BJ O’Sullivan (2015) GADEST, Abstracts. Mark conference C3 Study of defects in In0.53Ga0.47As/GaAs0.5Sb0.5 heterojunction diodes for characterizing trap assisted tunneling S Gupta, Eddy Simoen (UGent) , SE Kazzi, Q Smets, A AliReza, R Rooyackers, A Vandooren, A Verhulst, A Thean, Henk Vrielinck (UGent) , et al. (2015) GADEST, Abstracts. Mark conference C3 Low frequency noise spectroscopy of bulk and border traps in nanoscale devices Eddy Simoen (UGent) , B Cretu, W Fang, M Aoulaiche, JM Routoure, R Carin, J Luo, C Zhao and C Claeys (2015) GADEST, Abstracts. Mark conference C3 Theoretical study of the impact of stress and interstitial oxygen on the behavior of intrinsic point defects in growing CZ-Si crystals K Sueoka, K Nakamura and Jan Vanhellemont (UGent) (2015) GADEST, Abstracts.