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- Journal Article
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- open access
Understanding the optical degradation of 845 nm micro-transfer-printed VCSILs for photonic integrated circuits
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- Conference Paper
- open access
Analysis of defect-related optical degradation of VCSILs for photonic integrated circuits
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Schottky gate induced threshold voltage instabilities in p-GaN gate AlGaN/GaN HEMTs
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- Journal Article
- A1
- open access
Understanding the leakage mechanisms and breakdown limits of vertical GaN-on-Si p+n-n diodes : the road to reliable vertical MOSFETs
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- Journal Article
- A1
- open access
Challenges and perspectives for vertical GaN-on-Si trench MOS reliability : from leakage current analysis to gate stack optimization
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- Journal Article
- A1
- open access
Use of Bilayer gate insulator in GaN-on-Si Vertical Trench MOSFETs : impact on performance and reliability
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Demonstration of bilayer gate insulator for improved reliability in GaN-on-Si vertical transistors
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- Journal Article
- A1
- open access
Modeling of gate capacitance of GaN-based trench-gate vertical metal-oxide-semiconductor devices
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Modeling of the vertical leakage current in AlN/Si heterojunctions for GaN power applications
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Threshold voltage instability mechanisms in p-GaN gate AlGaN/GaN HEMTs
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Gate conduction mechanisms and lifetime modeling of p-Gate AlGaN/GaN high-electron-mobility transistors