Show 20 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: author="Dembszynski, Krzysztof" or (type exact bookEditor and editor="Dembszynski, Krzysztof") Add to list Conference Paper C1 open access Regret analysis for performance metrics in multi-label classification: the case of Hamming and subset zero-one loss Krzysztof Dembszynski, Willem Waegeman (UGent) , Weiwei Cheng and Eyke Hüllermeier (2010) LECTURE NOTES IN ARTIFICIAL INTELLIGENCE. 6321. p.280-295 Add to list Conference Paper C1 open access On label dependence in multilabel classification Krzysztof Dembszynski, Willem Waegeman (UGent) , Weiwei Cheng and Eyke Hüllermeier (2010) LastCFP : ICML workshop on learning from multi-label data, Proceedings.