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Epitaxial lateral overgrowth of GaN on sapphire - An examination of epitaxy quality using synchrotron X-ray topography.
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Material optimisation for AlGaN/GaN HFET applications.
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Chemical mapping of InGaN MQWs.
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Quantifying the smoothing of GaN epilayer growth by in situ laser interferometry.
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Quantifying the smoothing of GaN epilayers in MOVPE growth by in-situ laser reflectometry.
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Chemical ordering in wurtzite InxGa1-xN layers grown on (0001) sapphire by metalorganic vapor phase epitaxy.
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Highly uniform AlAs/GaAs, InGa(Al)P/GaAs and InGaAs(P)/InP structures grown in a three 2" wafer close-spaced vertical rotating disk reactor.
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High indium content InGaN films and quantum wells.
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Epitaxial lateral overgrowth of GaN by OMVPE.
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InGaN/GaN MQW blue light emitting diodes grown by OMVPE.
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Growth and in situ monitoring of GaN using IR interference effects.
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MOVPE growth optimization of high quality InGaN films.
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MOVPE growth optimization of high quality InGaN films
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High Indium content InGaN films and quantum wells