Show 15 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: parent exact "MICROSCOPY OF SEMICONDUCTING MATERIALS" Add to list Journal Article A1 Structural characterisation of advanced silicides H BENDER, O RICHARD, L NISTOR, A GUTAKOVSKII, C STUER and Christophe Detavernier (UGent) (2003) MICROSCOPY OF SEMICONDUCTING MATERIALS. p.453-462 Add to list Journal Article A1 Hexagonal growth hillocks of MOCVD-grown GaN on (0001) sapphire. A MOHAMMED, C TRAGER-COWAN, PG MIDDLETON, KP O'DONNELL, W VAN DER STRICHT, Ingrid Moerman (UGent) and Piet Demeester (UGent) (1997) MICROSCOPY OF SEMICONDUCTING MATERIALS. 157. p.235-238 Add to list Journal Article A1 A ballistic electron emission microscopy (BEEM)-investigation of the effects of reactive ion etching (RIE) and of chemical pretreatment on III-V semiconductors. Roland Vanmeirhaeghe (UGent) , GM VANALME, Lieve Goubert, Felix Cardon and Peter Van Daele (UGent) (1997) MICROSCOPY OF SEMICONDUCTING MATERIALS. 157. p.619-622 Add to list Journal Article A1 An XPS study of the effects of semiconductor processing treatments used to make InP optoelectronic devices. Roland Vanmeirhaeghe (UGent) , Lieve Goubert, Lucien Fiermans, Willy Laflere, Felix Cardon, Peter De Dobbelaere and Peter Van Daele (UGent) (1995) MICROSCOPY OF SEMICONDUCTING MATERIALS. 146. p.641-644