Show 15 5 10 15 20 50 100 250 Sort by year (new to old) Actions Download search results Subscribe to news feed Your filters: cql: author="Tu, KN*" or (type exact bookEditor and editor="Tu, KN*") Add to list Journal Article A1 The effect of sputtered W-based carbide diffusion barriers on the thermal stability and void formation in copper thin films Qi Xie (UGent) , Yu-Long Jiang, Koen De Keyser, Christophe Detavernier (UGent) , Davy Deduytsche (UGent) , Guo-Ping Ru, Xin-Ping Qu and KN Tu (2010) MICROELECTRONIC ENGINEERING. 87(12). p.2535-2539