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On the formation and structural properties of hexagonal rare earth (Y, Gd, Dy, Er and Yb) disilicide thin films
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In situ X-ray diffraction study of thin film Ir/Si solid state reactions
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Effect of Pt addition on growth stress and thermal stress of NiSi films
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Formation and morphological stability of NiSi in the presence of W, Ti, and Ta alloying elements
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Applications of synchrotron X-rays in microelectronics industry research
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Axiotaxy of CoSi2 thin films on Si(100) substrates and the effects of Ti alloying