Show 15 5 10 15 20 50 100 250 Sort by year (new to old) Actions Save this search Download search results Subscribe to news feed Your filters: cql: author="De Santi, C." or (type any "bookEditor issueEditor" and editor="De Santi, C.") Add to list Journal Article A1 Exploration of gate trench module for vertical GaN devices M. Ruzzarin, K. Geens, M. Borga, H. Liang, S. You, Benoit Bakeroot (UGent) , S. Decoutere, C. De Santi, A. Neviani, M. Meneghini, et al. (2020) MICROELECTRONICS RELIABILITY. 114(SI).