Show 100 5 10 15 20 50 100 250 Sort by year (new to old) Actions Save this search Download search results Subscribe to news feed Your filters: cql: parent exact "2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS)" Add to list Conference Paper P1 Mu s-range evaluation of threshold voltage instabilities of GaN-on-Si HEMTs with p-GaN gate E. Canato, F. Masin, M. Borga, E. Zanoni, M. Meneghini, G. Meneghesso, Arno Stockman (UGent) , A. Banerjee and P. Moens (2019) 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). In International Reliability Physics Symposium Add to list Conference Paper P1 A physical-statistical approach to AlGaN/GaN HEMT reliability Peter Moens and Arno Stockman (UGent) (2019) 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). In International Reliability Physics Symposium Add to list Conference Paper P1 Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors A. Tajalli, E. Canato, A. Nardo, M. Meneghini, Arno Stockman (UGent) , Peter Moens, E. Zanoni and G. Meneghesso (2019) 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). In International Reliability Physics Symposium Add to list Conference Paper P1 Perimeter driven transport in the p-GaN gate as a limiting factor for gate reliability S. Stoffels, N. Posthuma, S. Decoutere, Benoit Bakeroot (UGent) , A. N. Tallarico, Enrico Sangiorgi, Claudio Fiegna, J. Zheng, X. Ma, M. Borga, et al. (2019) 2019 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS). In International Reliability Physics Symposium