Show
Sort by
-
Anisotropic thermal expansion of Ni, Pd and Pt germanides and silicides
-
- Conference Paper
- C3
- open access
Thermal expansion coefficients of Ni, Pt and Pd germanides and silicides
-
On the formation and structural properties of hexagonal rare earth (Y, Gd, Dy, Er and Yb) disilicide thin films
-
Formation and texture of palladium germanides studied by in situ X-ray diffraction and pole figure measurements
-
Determination of the dominant diffusing species during nickel and palladium germanide formation
-
- Journal Article
- A1
- open access
In situ study of the growth properties of Ni-rare earth silicides for interlayer and alloy systems on Si(100)
-
In situ X-ray diffraction study of thin film Ir/Si solid state reactions
-
In situ x-ray diffraction study of Ni-Yb interlayer and alloy systems on Si(100)
-
The influence of Pt redistribution on Ni1-xPtxSi growth properties
-
High-k dielectrics and metal gates for future generation memory devices
-
Crystallization resistance of barium titanate zirconate ultrathin films from aqueous CSD: a study of cause and effect
-
High-k dielectrics for future generation memory devices (Invited Paper)
-
In situ x-ray diffraction study of metal induced crystallization of amorphous germanium
-
In-situ X-ray Diffraction study of Metal Induced Crystallization of amorphous silicon
-
0.5 nm EOT low leakage ALD SrTiO3 on TiN MIM capacitors for DRAM applications