Ghent University Academic Bibliography

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Refined DC and low-frequency noise characterization at room and cryogenic temperatures of vertically stacked silicon nanosheet FETs

Bogdan Cretu, Anabela Veloso and Eddy Simoen (UGent)

(2023) IEEE TRANSACTIONS ON ELECTRON DEVICES. 70(1). p.254-260
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Performance perspective of Gate-All-Around double nanosheet CMOS beyond high-speed logic applications

Eddy Simoen (UGent) , Carlos H.S. Coelho, Vanessa C.P. da Silva, João A. Martino, Paula Ghedini Der Agopian, Alberto Oliveira, Bogdan Cretu and Anabela Veloso

(2022) JOURNAL OF INTEGRATED CIRCUITS AND SYSTEMS. 17(2).
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Low temperature investigation of n-channel GAA vertically stacked silicon nanosheets

Bogdan Cretu, Anabela Veloso and Eddy Simoen (UGent)

(2021) 2021 JOINT INTERNATIONAL EUROSOI WORKSHOP AND INTERNATIONAL CONFERENCE ON ULTIMATE INTEGRATION ON SILICON (EUROSOI-ULIS). In International Conference on Ultimate Integration on Silicon
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Discussion on the figures of merit of identified traps located in the Si film : surface versus volume trap densities

Bogdan Cretu, Beya Nafaa, Eddy Simoen (UGent) , Geert Hellings, Dimitri Linten and Cor Claeys

(2020) ECS Transactions. 97(5). p.45-51
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Low-frequency noise spectroscopy of bulk and border traps in nanoscale devices

Eddy Simoen (UGent) , Bogdan Cretu, Wen Fang, Marc Aoulaiche, Jean-Marc Routoure, Regis Carin, Jun Luo, Chao Zhao and Cor Claeys

(2016) Solid State Phenomena. 242. p.449-458
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Low frequency noise spectroscopy of bulk and border traps in nanoscale devices

Eddy Simoen (UGent) , Bogdan Cretu, Wen Fang, Marc Aoulaiche, Jean-Marc Routoure, Regis Carin, Jun Luo, Chao Zhao and Cor Claeys

(2015) GADEST, Abstracts. In Solid State Phenomena 242. p.449-458
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Towards single-trap spectroscopy: generation-recombination noise in UTBOX SOI nMOSFETs

Eddy Simoen (UGent) , Bogdan Cretu, Wen Fang, Marc Aoulaiche, Jean-Marc Routoure, Regis Carin, Sara dos Santos, Jun Luo, Chao Zhao, Joao Antonio Martino, et al.

(2015) Physica Status Solidi C-Current Topics in Solid State Physics. 12(3). p.292-298

Academic Bibliography

Refined DC and low-frequency noise characterization at room and cryogenic temperatures of vertically stacked silicon nanosheet FETs

Performance perspective of Gate-All-Around double nanosheet CMOS beyond high-speed logic applications

Low temperature investigation of n-channel GAA vertically stacked silicon nanosheets

Discussion on the figures of merit of identified traps located in the Si film : surface versus volume trap densities

Low-frequency noise spectroscopy of bulk and border traps in nanoscale devices

Low frequency noise spectroscopy of bulk and border traps in nanoscale devices

Towards single-trap spectroscopy: generation-recombination noise in UTBOX SOI nMOSFETs

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