Polycapillary based confocal detection schemes for XRF micro- and nano-spectroscopy
- Author
- Bart Vekemans (UGent) , Björn De Samber (UGent) , Tom Schoonjans (UGent) , Geert Silversmit (UGent) , Laszlo Vincze (UGent) , Sylvia Schmitz, Frank Brenker, Roel Evens (UGent) , Karel De Schamphelaere (UGent) , Colin Janssen (UGent) , Bert Masschaele (UGent) , Luc Van Hoorebeke (UGent) , Rémi Tucoulou, Peter Cloetens, Manfred Burghammer, Jean Susini and Christian Riekel
- Organization
Downloads
-
(...).pdf
- full text
- |
- UGent only
- |
- |
- 12.18 KB
Citation
Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-970249
- MLA
- Vekemans, Bart, et al. “Polycapillary Based Confocal Detection Schemes for XRF Micro- and Nano-Spectroscopy.” Annual Denver X-Ray Conference, 58th, Abstracts, International Centre for Diffraction Data (ICDD), 2009.
- APA
- Vekemans, B., De Samber, B., Schoonjans, T., Silversmit, G., Vincze, L., Schmitz, S., … Riekel, C. (2009). Polycapillary based confocal detection schemes for XRF micro- and nano-spectroscopy. Annual Denver X-Ray Conference, 58th, Abstracts. Presented at the 58th Annual Denver X-ray Conference (DXC 2009), Colorado Springs, CO, USA.
- Chicago author-date
- Vekemans, Bart, Björn De Samber, Tom Schoonjans, Geert Silversmit, Laszlo Vincze, Sylvia Schmitz, Frank Brenker, et al. 2009. “Polycapillary Based Confocal Detection Schemes for XRF Micro- and Nano-Spectroscopy.” In Annual Denver X-Ray Conference, 58th, Abstracts. International Centre for Diffraction Data (ICDD).
- Chicago author-date (all authors)
- Vekemans, Bart, Björn De Samber, Tom Schoonjans, Geert Silversmit, Laszlo Vincze, Sylvia Schmitz, Frank Brenker, Roel Evens, Karel De Schamphelaere, Colin Janssen, Bert Masschaele, Luc Van Hoorebeke, Rémi Tucoulou, Peter Cloetens, Manfred Burghammer, Jean Susini, and Christian Riekel. 2009. “Polycapillary Based Confocal Detection Schemes for XRF Micro- and Nano-Spectroscopy.” In Annual Denver X-Ray Conference, 58th, Abstracts. International Centre for Diffraction Data (ICDD).
- Vancouver
- 1.Vekemans B, De Samber B, Schoonjans T, Silversmit G, Vincze L, Schmitz S, et al. Polycapillary based confocal detection schemes for XRF micro- and nano-spectroscopy. In: Annual Denver X-ray Conference, 58th, Abstracts. International Centre for Diffraction Data (ICDD); 2009.
- IEEE
- [1]B. Vekemans et al., “Polycapillary based confocal detection schemes for XRF micro- and nano-spectroscopy,” in Annual Denver X-ray Conference, 58th, Abstracts, Colorado Springs, CO, USA, 2009.
@inproceedings{970249,
author = {{Vekemans, Bart and De Samber, Björn and Schoonjans, Tom and Silversmit, Geert and Vincze, Laszlo and Schmitz, Sylvia and Brenker, Frank and Evens, Roel and De Schamphelaere, Karel and Janssen, Colin and Masschaele, Bert and Van Hoorebeke, Luc and Tucoulou, Rémi and Cloetens, Peter and Burghammer, Manfred and Susini, Jean and Riekel, Christian}},
booktitle = {{Annual Denver X-ray Conference, 58th, Abstracts}},
language = {{eng}},
location = {{Colorado Springs, CO, USA}},
pages = {{1}},
publisher = {{International Centre for Diffraction Data (ICDD)}},
title = {{Polycapillary based confocal detection schemes for XRF micro- and nano-spectroscopy}},
url = {{http://www.dxcicdd.com/09/PDF/Vekemans_1.pdf}},
year = {{2009}},
}