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Transmission electron microscopy analysis of a coated conductor produced by chemical deposition methods

(2010) ACTA MATERIALIA. 58(5). p.1489-1494
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Keywords
Thin films, Sol-gel, Y2CU2O5, MICROSTRUCTURE, FABRICATION, FILMS, GROWTH, Interface structures, Ceramic superconductors, LA2ZR2O7 BUFFER LAYERS, PLANAR DEFECTS, STEM

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Please use this url to cite or link to this publication:

MLA
Cloet, Veerle, et al. “Transmission Electron Microscopy Analysis of a Coated Conductor Produced by Chemical Deposition Methods.” ACTA MATERIALIA, vol. 58, no. 5, 2010, pp. 1489–94.
APA
Cloet, V., Thersleff, T., Stadel, O., Hoste, S., Holzapfel, B., & Van Driessche, I. (2010). Transmission electron microscopy analysis of a coated conductor produced by chemical deposition methods. ACTA MATERIALIA, 58(5), 1489–1494.
Chicago author-date
Cloet, Veerle, T Thersleff, O Stadel, Serge Hoste, B Holzapfel, and Isabel Van Driessche. 2010. “Transmission Electron Microscopy Analysis of a Coated Conductor Produced by Chemical Deposition Methods.” ACTA MATERIALIA 58 (5): 1489–94.
Chicago author-date (all authors)
Cloet, Veerle, T Thersleff, O Stadel, Serge Hoste, B Holzapfel, and Isabel Van Driessche. 2010. “Transmission Electron Microscopy Analysis of a Coated Conductor Produced by Chemical Deposition Methods.” ACTA MATERIALIA 58 (5): 1489–1494.
Vancouver
1.
Cloet V, Thersleff T, Stadel O, Hoste S, Holzapfel B, Van Driessche I. Transmission electron microscopy analysis of a coated conductor produced by chemical deposition methods. ACTA MATERIALIA. 2010;58(5):1489–94.
IEEE
[1]
V. Cloet, T. Thersleff, O. Stadel, S. Hoste, B. Holzapfel, and I. Van Driessche, “Transmission electron microscopy analysis of a coated conductor produced by chemical deposition methods,” ACTA MATERIALIA, vol. 58, no. 5, pp. 1489–1494, 2010.
@article{941380,
  author       = {Cloet, Veerle and Thersleff, T and Stadel, O and Hoste, Serge and Holzapfel, B and Van Driessche, Isabel},
  issn         = {1359-6454},
  journal      = {ACTA MATERIALIA},
  keywords     = {Thin films,Sol-gel,Y2CU2O5,MICROSTRUCTURE,FABRICATION,FILMS,GROWTH,Interface structures,Ceramic superconductors,LA2ZR2O7 BUFFER LAYERS,PLANAR DEFECTS,STEM},
  language     = {eng},
  number       = {5},
  pages        = {1489--1494},
  title        = {Transmission electron microscopy analysis of a coated conductor produced by chemical deposition methods},
  url          = {http://dx.doi.org/10.1016/j.actamat.2009.10.055},
  volume       = {58},
  year         = {2010},
}

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