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Transmission electron microscopy analysis of a coated conductor produced by chemical deposition methods

(2010) ACTA MATERIALIA. 58(5). p.1489-1494
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Thin films, Sol-gel, Y2CU2O5, MICROSTRUCTURE, FABRICATION, FILMS, GROWTH, Interface structures, Ceramic superconductors, LA2ZR2O7 BUFFER LAYERS, PLANAR DEFECTS, STEM

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Citation

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Chicago
Cloet, Veerle, T Thersleff, O Stadel, Serge Hoste, B Holzapfel, and Isabel Van Driessche. 2010. “Transmission Electron Microscopy Analysis of a Coated Conductor Produced by Chemical Deposition Methods.” Acta Materialia 58 (5): 1489–1494.
APA
Cloet, V., Thersleff, T., Stadel, O., Hoste, S., Holzapfel, B., & Van Driessche, I. (2010). Transmission electron microscopy analysis of a coated conductor produced by chemical deposition methods. ACTA MATERIALIA, 58(5), 1489–1494.
Vancouver
1.
Cloet V, Thersleff T, Stadel O, Hoste S, Holzapfel B, Van Driessche I. Transmission electron microscopy analysis of a coated conductor produced by chemical deposition methods. ACTA MATERIALIA. 2010;58(5):1489–94.
MLA
Cloet, Veerle, T Thersleff, O Stadel, et al. “Transmission Electron Microscopy Analysis of a Coated Conductor Produced by Chemical Deposition Methods.” ACTA MATERIALIA 58.5 (2010): 1489–1494. Print.
@article{941380,
  author       = {Cloet, Veerle and Thersleff, T and Stadel, O and Hoste, Serge and Holzapfel, B and Van Driessche, Isabel},
  issn         = {1359-6454},
  journal      = {ACTA MATERIALIA},
  language     = {eng},
  number       = {5},
  pages        = {1489--1494},
  title        = {Transmission electron microscopy analysis of a coated conductor produced by chemical deposition methods},
  url          = {http://dx.doi.org/10.1016/j.actamat.2009.10.055},
  volume       = {58},
  year         = {2010},
}

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