An evaluation of nanoparticle distribution in solution-derived YBa2Cu3O7−δ nanocomposite thin films by XPS depth profiling in combination with TEM analysis
- Author
- Els Bruneel (UGent) , Hannes Rijckaert (UGent) , Javier Diez Sierra, Klaartje De Buysser (UGent) and Isabel Van Driessche (UGent)
- Organization
- Project
- Abstract
- This work discusses the development of an analysis routine for evaluating the nanoparticle distribution in nanocomposite thin films. YBa2Cu3O7-delta (YBCO) nanocomposite films were synthesized via a chemical solution deposition approach starting from colloidal YBCO solutions with preformed nanoparticles. The distribution of the nanoparticles and interlayer diffusion are evaluated with X-ray photoelectron spectroscopy (XPS) depth profiling and compared with cross-sectional transmission electron microscopy (TEM) images. It is shown that the combination of both techniques deliver valuable information on the film properties as nanoparticle distribution, film thickness and interlayer diffusion.
- Keywords
- Inorganic Chemistry, Condensed Matter Physics, General Materials Science, General Chemical Engineering, XPS, TEM, depth profiling, distribution, nanoparticles, chemical solution deposition, BAZRO3
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Citation
Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-8746576
- MLA
- Bruneel, Els, et al. “An Evaluation of Nanoparticle Distribution in Solution-Derived YBa2Cu3O7−δ Nanocomposite Thin Films by XPS Depth Profiling in Combination with TEM Analysis.” CRYSTALS, vol. 12, no. 3, 2022, doi:10.3390/cryst12030410.
- APA
- Bruneel, E., Rijckaert, H., Diez Sierra, J., De Buysser, K., & Van Driessche, I. (2022). An evaluation of nanoparticle distribution in solution-derived YBa2Cu3O7−δ nanocomposite thin films by XPS depth profiling in combination with TEM analysis. CRYSTALS, 12(3). https://doi.org/10.3390/cryst12030410
- Chicago author-date
- Bruneel, Els, Hannes Rijckaert, Javier Diez Sierra, Klaartje De Buysser, and Isabel Van Driessche. 2022. “An Evaluation of Nanoparticle Distribution in Solution-Derived YBa2Cu3O7−δ Nanocomposite Thin Films by XPS Depth Profiling in Combination with TEM Analysis.” CRYSTALS 12 (3). https://doi.org/10.3390/cryst12030410.
- Chicago author-date (all authors)
- Bruneel, Els, Hannes Rijckaert, Javier Diez Sierra, Klaartje De Buysser, and Isabel Van Driessche. 2022. “An Evaluation of Nanoparticle Distribution in Solution-Derived YBa2Cu3O7−δ Nanocomposite Thin Films by XPS Depth Profiling in Combination with TEM Analysis.” CRYSTALS 12 (3). doi:10.3390/cryst12030410.
- Vancouver
- 1.Bruneel E, Rijckaert H, Diez Sierra J, De Buysser K, Van Driessche I. An evaluation of nanoparticle distribution in solution-derived YBa2Cu3O7−δ nanocomposite thin films by XPS depth profiling in combination with TEM analysis. CRYSTALS. 2022;12(3).
- IEEE
- [1]E. Bruneel, H. Rijckaert, J. Diez Sierra, K. De Buysser, and I. Van Driessche, “An evaluation of nanoparticle distribution in solution-derived YBa2Cu3O7−δ nanocomposite thin films by XPS depth profiling in combination with TEM analysis,” CRYSTALS, vol. 12, no. 3, 2022.
@article{8746576,
abstract = {{This work discusses the development of an analysis routine for evaluating the nanoparticle distribution in nanocomposite thin films. YBa2Cu3O7-delta (YBCO) nanocomposite films were synthesized via a chemical solution deposition approach starting from colloidal YBCO solutions with preformed nanoparticles. The distribution of the nanoparticles and interlayer diffusion are evaluated with X-ray photoelectron spectroscopy (XPS) depth profiling and compared with cross-sectional transmission electron microscopy (TEM) images. It is shown that the combination of both techniques deliver valuable information on the film properties as nanoparticle distribution, film thickness and interlayer diffusion.}},
articleno = {{410}},
author = {{Bruneel, Els and Rijckaert, Hannes and Diez Sierra, Javier and De Buysser, Klaartje and Van Driessche, Isabel}},
issn = {{2073-4352}},
journal = {{CRYSTALS}},
keywords = {{Inorganic Chemistry,Condensed Matter Physics,General Materials Science,General Chemical Engineering,XPS,TEM,depth profiling,distribution,nanoparticles,chemical solution deposition,BAZRO3}},
language = {{eng}},
number = {{3}},
title = {{An evaluation of nanoparticle distribution in solution-derived YBa2Cu3O7−δ nanocomposite thin films by XPS depth profiling in combination with TEM analysis}},
url = {{http://doi.org/10.3390/cryst12030410}},
volume = {{12}},
year = {{2022}},
}
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