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Fast laser scanning imaging for single nanoparticle analysis

Lucas Oorlynck (UGent) , Yera Ussembayev (UGent) , Juan Fraire (UGent) , Charlotte Hinnekens (UGent) , Kevin Braeckmans (UGent) and Filip Strubbe (UGent)
(2022) SPIE Photonics Europe : Unconventional Optical Imaging III, Abstracts.
Author
Organization
Abstract
Nanoparticle-based applications require increasingly sensitive screening tools, necessitating single-particle, multi-parameter analysis techniques in the native liquid environment. In this work, we present a laser-scanning camera using acousto-optic deflectors and a single-photon counting module. By scanning a highly focused laser beam (532 nm) across a grid of pixels, and by detecting the associated emitted photons with high sensitivity, fluorescent nanoparticles of 100 nm and below can be imaged at frame rates up to 12 kHz.

Citation

Please use this url to cite or link to this publication:

MLA
Oorlynck, Lucas, et al. “Fast Laser Scanning Imaging for Single Nanoparticle Analysis.” SPIE Photonics Europe : Unconventional Optical Imaging III, Abstracts, 2022.
APA
Oorlynck, L., Ussembayev, Y., Fraire, J., Hinnekens, C., Braeckmans, K., & Strubbe, F. (2022). Fast laser scanning imaging for single nanoparticle analysis. SPIE Photonics Europe : Unconventional Optical Imaging III, Abstracts. Presented at the SPIE Photonics Europe, Strasbourg, France.
Chicago author-date
Oorlynck, Lucas, Yera Ussembayev, Juan Fraire, Charlotte Hinnekens, Kevin Braeckmans, and Filip Strubbe. 2022. “Fast Laser Scanning Imaging for Single Nanoparticle Analysis.” In SPIE Photonics Europe : Unconventional Optical Imaging III, Abstracts.
Chicago author-date (all authors)
Oorlynck, Lucas, Yera Ussembayev, Juan Fraire, Charlotte Hinnekens, Kevin Braeckmans, and Filip Strubbe. 2022. “Fast Laser Scanning Imaging for Single Nanoparticle Analysis.” In SPIE Photonics Europe : Unconventional Optical Imaging III, Abstracts.
Vancouver
1.
Oorlynck L, Ussembayev Y, Fraire J, Hinnekens C, Braeckmans K, Strubbe F. Fast laser scanning imaging for single nanoparticle analysis. In: SPIE Photonics Europe : Unconventional Optical Imaging III, Abstracts. 2022.
IEEE
[1]
L. Oorlynck, Y. Ussembayev, J. Fraire, C. Hinnekens, K. Braeckmans, and F. Strubbe, “Fast laser scanning imaging for single nanoparticle analysis,” in SPIE Photonics Europe : Unconventional Optical Imaging III, Abstracts, Strasbourg, France, 2022.
@inproceedings{8743489,
  abstract     = {{Nanoparticle-based applications require increasingly sensitive screening tools, necessitating single-particle, multi-parameter analysis techniques in the native liquid environment. In this work, we present a laser-scanning camera using acousto-optic deflectors and a single-photon counting module. By scanning a highly focused laser beam (532 nm) across a grid of pixels, and by detecting the associated emitted photons with high sensitivity, fluorescent nanoparticles of 100 nm and below can be imaged at frame rates up to 12 kHz.}},
  author       = {{Oorlynck, Lucas and Ussembayev, Yera and Fraire, Juan and Hinnekens, Charlotte and Braeckmans, Kevin and Strubbe, Filip}},
  booktitle    = {{SPIE Photonics Europe : Unconventional Optical Imaging III, Abstracts}},
  language     = {{eng}},
  location     = {{Strasbourg, France}},
  pages        = {{1}},
  title        = {{Fast laser scanning imaging for single nanoparticle analysis}},
  url          = {{https://spie.org/photonics-europe/presentation/Fast-laser-scanning-imaging-for-single-nanoparticle-analysis/12136-31?enableBackToBrowse=true}},
  year         = {{2022}},
}