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X-ray fluorescence and emission : particle-induced X-ray emission

Willy Maenhaut (UGent)
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Abstract
The basic principles, instrumentation, sample types, and applications of the particle-induced X-ray emission (PIXE) technique are presented. PIXE is an ion beam analysis (IBA) technique, whereby energetic heavy charged particles (usually protons of 1–4 MeV) are used to induce element-specific X-ray emission. The X-rays are generally measured with an energy-dispersive solid state detector, nowadays typically a silicon drift detector (SDD), and the elements from Na to U can be detected with good sensitivity and good detection limits, down to 0.1 mg kg− 1 in favorable cases. By combining PIXE with other IBA techniques also the light elements (from H to F) can be measured.
Keywords
Aerosols, Archeological samples, Biological samples, Elements, Geological samples, Ion beam analysis Microbeams, PIXE, Protons, X-ray emission analysis

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MLA
Maenhaut, Willy. “X-Ray Fluorescence and Emission : Particle-Induced X-Ray Emission.” Encyclopedia of Analytical Science, edited by Paul Worsfold et al., 3rd ed., Elsevier, 2019, pp. 432–42, doi:10.1016/B978-0-12-409547-2.00580-1.
APA
Maenhaut, W. (2019). X-ray fluorescence and emission : particle-induced X-ray emission. In P. Worsfold, C. Poole, A. Townshend, & M. Miró (Eds.), Encyclopedia of analytical science (3rd ed., pp. 432–442). https://doi.org/10.1016/B978-0-12-409547-2.00580-1
Chicago author-date
Maenhaut, Willy. 2019. “X-Ray Fluorescence and Emission : Particle-Induced X-Ray Emission.” In Encyclopedia of Analytical Science, edited by Paul Worsfold, Colin Poole, Alan Townshend, and Manuel Miró, 3rd ed., 432–42. Elsevier. https://doi.org/10.1016/B978-0-12-409547-2.00580-1.
Chicago author-date (all authors)
Maenhaut, Willy. 2019. “X-Ray Fluorescence and Emission : Particle-Induced X-Ray Emission.” In Encyclopedia of Analytical Science, ed by. Paul Worsfold, Colin Poole, Alan Townshend, and Manuel Miró, 432–442. 3rd ed. Elsevier. doi:10.1016/B978-0-12-409547-2.00580-1.
Vancouver
1.
Maenhaut W. X-ray fluorescence and emission : particle-induced X-ray emission. In: Worsfold P, Poole C, Townshend A, Miró M, editors. Encyclopedia of analytical science. 3rd ed. Elsevier; 2019. p. 432–42.
IEEE
[1]
W. Maenhaut, “X-ray fluorescence and emission : particle-induced X-ray emission,” in Encyclopedia of analytical science, 3rd ed., P. Worsfold, C. Poole, A. Townshend, and M. Miró, Eds. Elsevier, 2019, pp. 432–442.
@incollection{8693882,
  abstract     = {{The basic principles, instrumentation, sample types, and applications of the particle-induced X-ray emission (PIXE) technique are presented. PIXE is an ion beam analysis (IBA) technique, whereby energetic heavy charged particles (usually protons of 1–4 MeV) are used to induce element-specific X-ray emission. The X-rays are generally measured with an energy-dispersive solid state detector, nowadays typically a silicon drift detector (SDD), and the elements from Na to U can be detected with good sensitivity and good detection limits, down to 0.1 mg kg− 1 in favorable cases. By combining PIXE with other IBA techniques also the light elements (from H to F) can be measured.}},
  author       = {{Maenhaut, Willy}},
  booktitle    = {{Encyclopedia of analytical science}},
  editor       = {{Worsfold, Paul and Poole, Colin and Townshend, Alan and Miró, Manuel}},
  isbn         = {{9780081019832}},
  keywords     = {{Aerosols,Archeological samples,Biological samples,Elements,Geological samples,Ion beam analysis Microbeams,PIXE,Protons,X-ray emission analysis}},
  language     = {{eng}},
  pages        = {{432--442}},
  publisher    = {{Elsevier}},
  title        = {{X-ray fluorescence and emission : particle-induced X-ray emission}},
  url          = {{http://doi.org/10.1016/B978-0-12-409547-2.00580-1}},
  year         = {{2019}},
}

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