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A Machine Learning-Based Epistemic Modeling Framework for EMC and SI Assessment

Duygu Kan (UGent) , Simon De Ridder (UGent) , Domenico Spina (UGent) , Tom Dhaene (UGent) , Hendrik Rogier (UGent) , Dries Vande Ginste (UGent) and Flavia Grassi
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Citation

Please use this url to cite or link to this publication:

MLA
Kan, Duygu, et al. “A Machine Learning-Based Epistemic Modeling Framework for EMC and SI Assessment.” 2020 IEEE 24th Workshop on Signal and Power Integrity (SPI), 2020, pp. 1–4, doi:10.1109/spi48784.2020.9218168.
APA
Kan, D., De Ridder, S., Spina, D., Dhaene, T., Rogier, H., Vande Ginste, D., & Grassi, F. (2020). A Machine Learning-Based Epistemic Modeling Framework for EMC and SI Assessment. In 2020 IEEE 24th Workshop on Signal and Power Integrity (SPI) (pp. 1–4). online. https://doi.org/10.1109/spi48784.2020.9218168
Chicago author-date
Kan, Duygu, Simon De Ridder, Domenico Spina, Tom Dhaene, Hendrik Rogier, Dries Vande Ginste, and Flavia Grassi. 2020. “A Machine Learning-Based Epistemic Modeling Framework for EMC and SI Assessment.” In 2020 IEEE 24th Workshop on Signal and Power Integrity (SPI), 1–4. https://doi.org/10.1109/spi48784.2020.9218168.
Chicago author-date (all authors)
Kan, Duygu, Simon De Ridder, Domenico Spina, Tom Dhaene, Hendrik Rogier, Dries Vande Ginste, and Flavia Grassi. 2020. “A Machine Learning-Based Epistemic Modeling Framework for EMC and SI Assessment.” In 2020 IEEE 24th Workshop on Signal and Power Integrity (SPI), 1–4. doi:10.1109/spi48784.2020.9218168.
Vancouver
1.
Kan D, De Ridder S, Spina D, Dhaene T, Rogier H, Vande Ginste D, et al. A Machine Learning-Based Epistemic Modeling Framework for EMC and SI Assessment. In: 2020 IEEE 24th Workshop on Signal and Power Integrity (SPI). 2020. p. 1–4.
IEEE
[1]
D. Kan et al., “A Machine Learning-Based Epistemic Modeling Framework for EMC and SI Assessment,” in 2020 IEEE 24th Workshop on Signal and Power Integrity (SPI), online, 2020, pp. 1–4.
@inproceedings{8678689,
  author       = {Kan, Duygu and De Ridder, Simon and Spina, Domenico and Dhaene, Tom and Rogier, Hendrik and Vande Ginste, Dries and Grassi, Flavia},
  booktitle    = {2020 IEEE 24th Workshop on Signal and Power Integrity (SPI)},
  isbn         = {9781728142043},
  language     = {und},
  location     = {online},
  pages        = {1--4},
  title        = {A Machine Learning-Based Epistemic Modeling Framework for EMC and SI Assessment},
  url          = {http://dx.doi.org/10.1109/spi48784.2020.9218168},
  year         = {2020},
}

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