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Statistical modeling of frequency responses using linear Bayesian vector fitting

Simon De Ridder (UGent) , Dirk Deschrijver (UGent) , Domenico Spina (UGent) , Dries Vande Ginste (UGent) and Tom Dhaene (UGent)
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Abstract
This article presents a Bayesian extension of the vector fitting (VF) procedure for rational approximation of frequency-domain responses. The proposed method treats the linear part of VF in a Bayesian way, while propagating distributions through the nonlinear part by sampling. As such, it is capable of providing data-driven uncertainty information along with the rational fit. The Bayesian VF technique is applied to two realistic design examples, a double folded stub filter and a RAM memory channel, demonstrating its validity and highlighting three potential applications of this novel framework.
Keywords
RATIONAL APPROXIMATION, SAMPLING ALGORITHM, MULTIPORT SYSTEMS, adaptive sampling, bayesian inference, macromodeling

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MLA
De Ridder, Simon, et al. “Statistical Modeling of Frequency Responses Using Linear Bayesian Vector Fitting.” INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS, 2020, doi:10.1002/jnm.2762.
APA
De Ridder, S., Deschrijver, D., Spina, D., Vande Ginste, D., & Dhaene, T. (2020). Statistical modeling of frequency responses using linear Bayesian vector fitting. INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS. https://doi.org/10.1002/jnm.2762
Chicago author-date
De Ridder, Simon, Dirk Deschrijver, Domenico Spina, Dries Vande Ginste, and Tom Dhaene. 2020. “Statistical Modeling of Frequency Responses Using Linear Bayesian Vector Fitting.” INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS. https://doi.org/10.1002/jnm.2762.
Chicago author-date (all authors)
De Ridder, Simon, Dirk Deschrijver, Domenico Spina, Dries Vande Ginste, and Tom Dhaene. 2020. “Statistical Modeling of Frequency Responses Using Linear Bayesian Vector Fitting.” INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS. doi:10.1002/jnm.2762.
Vancouver
1.
De Ridder S, Deschrijver D, Spina D, Vande Ginste D, Dhaene T. Statistical modeling of frequency responses using linear Bayesian vector fitting. INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS. 2020;
IEEE
[1]
S. De Ridder, D. Deschrijver, D. Spina, D. Vande Ginste, and T. Dhaene, “Statistical modeling of frequency responses using linear Bayesian vector fitting,” INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS, 2020.
@article{8665488,
  abstract     = {This article presents a Bayesian extension of the vector fitting (VF) procedure for rational approximation of frequency-domain responses. The proposed method treats the linear part of VF in a Bayesian way, while propagating distributions through the nonlinear part by sampling. As such, it is capable of providing data-driven uncertainty information along with the rational fit. The Bayesian VF technique is applied to two realistic design examples, a double folded stub filter and a RAM memory channel, demonstrating its validity and highlighting three potential applications of this novel framework.},
  articleno    = {e2762},
  author       = {De Ridder, Simon and Deschrijver, Dirk and Spina, Domenico and Vande Ginste, Dries and Dhaene, Tom},
  issn         = {0894-3370},
  journal      = {INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS},
  keywords     = {RATIONAL APPROXIMATION,SAMPLING ALGORITHM,MULTIPORT SYSTEMS,adaptive sampling,bayesian inference,macromodeling},
  language     = {eng},
  pages        = {17},
  title        = {Statistical modeling of frequency responses using linear Bayesian vector fitting},
  url          = {http://dx.doi.org/10.1002/jnm.2762},
  year         = {2020},
}

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